Semiconductor devices measurements & tests / (رقم التسجيلة. 89514)

تفاصيل مارك
000 -LEADER
fixed length control field	00443nam a2200193zu 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field
040 ## - CATALOGING SOURCE
Language of cataloging	eng
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title	eng
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number	621.38153042
Item number	G866
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name	Grin, G.
245 10 - TITLE STATEMENT
Title	Semiconductor devices measurements & tests /
Statement of responsibility, etc	G. Grin.
264 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc	Moscow :
Name of publisher, distributor, etc	Mir,
Date of publication, distribution, etc	1980.
300 ## - PHYSICAL DESCRIPTION
Extent	208 ;
Dimensions	24 cm.
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element	Engineering
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term	Semiconductors.
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term	Measurement.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type	كتاب

المقتنيات
Home library	Current library	Shelving location	Date acquired	Inventory number	Total Checkouts	Full call number	Barcode	Date last seen	Copy number	Koha item type	Public note
main library	main library		22/05/1989	021598		621.38153042 G866	8705159	05/10/2019	G866	كتاب	208